Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences Broken Cross Line Reticle RET 50, 19 mm, 13 µm Line width
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 19 mm
Line width: 13 µm
Electron Microscopy Sciences Cross Scale Reticle RET 32, 21 mm, 20 mm Scale, 0.10 mm x 200 Divisions
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 21 mm
Scale: 20 mm
Divisions: 0.10 mm x 200
Electron Microscopy Sciences Microscope Graticule NE120 Horizontal, 21 mm, 20 mm with 100 divisions of 0.1 mm
These scales are used for the measuring of lengths of specimen or distances between points on a variety of different shaped objects. By dividing the division of the chosen graticule by the magnification of the objective one obtains an approximate value that each division will represent on the stage. Horizontal micrometer scale.
Size: 21 mm
Electron Microscopy Sciences Holey Carbon Grid for Cryo TEM, Mesh: 200. Grid: Copper. Hole: 1.2 µm. Spacing: 1.3 µm., 10/PK
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness. Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes. C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. Mesh: 200. Grid: Copper . Hole: 1.2 µm . Spacing: 1.3 µm.
Electron Microscopy Sciences EMS Microscope Stage Micrometer SM-12
SM-12 is useful for calibration of magnification in microscopes and other optical magnification systems.. It comes in a sturdy wooden box. Chrome on Glass. Linear Reference Scales: Glass Size - 1" x 3" (25 mm x 75 mm). Scale Length - 0.08 inch X axis, 2.0 mm X & Y axis. Divisions- English = 0.001”; Metric = 25um (0.025 mm). No numerical scale labeling.
Electron Microscopy Sciences Double Cross Lines Reticle RET 64, 21 mm, 1.0 mm Gap
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 21 mm
Gap: 1.0 mm
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-2/1-4C, 400 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 2.0 µm holes with 1.0 µm spacing.
Mesh: 400
Material: Copper
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-4/2-4C, 400 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 4.0 µm holes with 2.0 µm spacing.
Mesh: 400
Material: Copper
Electron Microscopy Sciences Press-To-Seal Clear Silicone Sheet, 1.6 mm thick
Isolate specimens using press-to-seal silicone isolators with removable hydrophobic barriers. Silicone isolators allow researchers to isolate specimens using removable hydrophobic barriers. They may be used to isolate cells grown in culture dishes or separate multiple specimens affixed to microscope slides. One Side Adhesive.
Thickness: 1.6 mm
Electron Microscopy Sciences Integrated EyePiece (Simplified) Graticle G50, 21mm
The eyepiece reticle has a 100 point integrating pattern. It is a slightly simplified version of G47 pattern.
Size: 21 mm
Electron Microscopy Sciences Double Cross Lines Reticle RET 62, 21 mm, 0.125 mm Gap
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 21 mm
Gap: 0.125 mm
Electron Microscopy Sciences Lennox Grain Analysis Graticle NG21, Custom
The eyepiece reticle is used for Lennox grain size analysis. The pattern comprises and array of dashed squares and crosses.
Size: Custom
Electron Microscopy Sciences EMS LYNX II Tissue Processor HP Sample Arm Seal
For use with the LYNX II Automated Tissue Processor.
Electron Microscopy Sciences Calibration Specimen 150-1D, Unmounted
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Has a nominal period (pitch) of 150 nm, one dimensional, fabricated on a transparent substrate (Aluminum lines on glass).
Mount: Unmounted